In Situ Atomic Force Microscopy: New Approaches for Nanomechanics and Nanotribology

Robert W. Carpick1

  • 1University of Pennsylvania

Details

14:45 - 15:30 | Tue 25 Jul | Grand Ballroom #5 | TuW3SPM.2

Session: Workshop: Scanning Probe Microscopy, Beyond Topography III

Abstract

In this talk, I will review recent developments using in situ atomic force microscopy (AFM) methods to obtain novel insights into nanomechanical and nanotribological behavior. First, I will discuss results from nanoindentation and sliding performed in situ using transmission electron microscopy (TEM). This has enabled the first ever confirmation of atom-by-atom wear in sliding silicon and diamond nanocontacts, and enabled new insights to be obtained regarding the nature of adhesion between carbon-based materials. Second, I will discuss a novel method used to create and image nanostructures in situ using fluid-immersed AFM, where the fluid includes a reactive species that is activated by local stress applied to the species when confined at the tip-sample contact. This enables new insights to be gained into the formation of protective tribofilms, which are crucial for wear protection in engines, bearings, and gears. It also permits the performance of a new type of additive manufacturing process at the nanometer scale, which we term “Nanotribological Printing” (NTP).