Multi-Layer Spatial Iterative Learning Control for Micro-Additive Manufacturing

Leontine Aarnoudse1, Christopher Pannier2, Zahra Afkhami2, Tom Oomen1, Kira Barton3

  • 1Eindhoven University of Technology
  • 2University of Michigan
  • 3University of Michigan at Ann Arbor

Details

15:10 - 15:30 | Wed 4 Sep | Room FH 6 | WeD6.3

Session: Iterative Learning Control

Abstract

Spatial iterative learning control (SILC) has been used in the control of additive manufacturing systems that can be described by their spatial dynamics. Since the current framework is limited to single-layer parts, the aim of this paper is to provide an approach to multi-layer SILC using learning in the layer-to-layer dimension. Mathematical formulation of a multi-layer SILC controller is provided, and active feedback control is demonstrated to reduce the error accumulation over the iterations. Simulation results using a model of high-resolution e-jet printing verify performance improvements for the proposed framework.