Atomic Force Microscope for Harsh Environments

Urs Staufer1

  • 1Delft University of Technology

Details

13:40 - 14:30 | Wed 4 Sep | Room FH 5 | WeC2.1

Session: Atomic Force Microscope for Harsh Environments

Abstract

Our attempt to build an atomic force microscope [AFM] for in-line metrology began with a simple question: Can you build an AFM that works on Mars? Of course! Really? Operating any instrument on Mars means running it in an autonomous way – radio signals require several minutes to reach Earth, hence, an operator’s intervention would always be too late! The environmental conditions on planet Mars are another challenge, likewise is the journey to Mars especially in the beginning and at the end rough, not to mention the costs for this travel. Lucky enough, we were offered a free trip if we contribute and deliver the instrument in time. Once landed on Mars, it turned out that temperature variations were our biggest enemies. After having identified and circumvented them, we produced unsurpassed measurements and contributed to the scientific results of the Phoenix Mars Mission. Space proved technology, one might think, would make an instrument fit for industrial applications as well. However, while demonstrated robustness and autonomy are indeed an advantage, we were confronted with more and completely different requirements when we tried making this step back from Mars to Earth. Quick time to data and their traceability were the most important operational requirements; vibrations during measurements, which were very low on Mars, and potentially moving samples were prominent environmental challenges we faced, and which we addressed with mechatronic means.