Optoelectronic and Electrical Scanning Probe Methods for Functional Device Characterization— from Solar Cells to Electrochemical Devices

Abstract

In emerging nanostructured electronics, particularly those based on hybrid organic-inorganic perovskites and conducting polymer systems, we need methods that link nanoscale information with device performance. Evaluating such structure-function relationships in real space is now possible with advances in atomic force microscopy (AFM). In this talk, we will present our methods for probing nanostructured electronic devices using a range of different techniques, particularly (photo)conductive AFM, time-resolved electrostatic force microscopy, scanning Kelvin probe microscopy, and electrochemical strain microscopy. In particular, we will first focus on applying correlations in local perovskite structure with electrical and optoelectronic results to extract meaningful information regarding the contacts. We will then compare how strain microscopy can also elucidate the function of modern conducting polymer architectures. We also discuss comparative advantages of different optoelectronic AFM methods in the context of functional device characterization.