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NANO 2017
Presentation
Specimen Preparation for TEM using Focused Ion Beam/Scanning Electron Microscopy Dual Beam Technique
Tan Susheng
1
1
University of Pittsburgh
Details
09:15 - 10:00
| Tue 25 Jul |
City Center B
| TuW1EF.1
Session:
Workshop: FEIB: Basics and Applications I
Abstract